Reliability & Failure Analysis (EMT 480/3)

This book shows how to build in, evaluate, and demonstrate reliability & availability of components, equipment, systems. It presents the state-of-the-art of reliability engineering, both in theory and practice, and is based on the author's 30 years experience in this field, half in industry and half as Professor of Reliability Engineering at the ETH, Zurich. The structure of the book allows rapid access to practical results. Besides extensions to cost models and approximate expressions, new in this edition are investigations on common cause failures, phased-mission systems, availability demonstration and estimation, confidence limits at system level, trend tests for early failures or wearout, as well as a review of maintenance strategies, an introduction to Petri nets and dynamic FTA, and a set of problems for home-work. Methods and tools are given in a way that they can be tailored to cover different reliability requirement levels and be used for safety analysis as well. This book is a textbook establishing a link between theory and practice, with a large number of tables, figures, and examples to support the practical aspects.

For electronic parts suppliers, systems designers, and fabricators--to help protect against product and system failure: Features: components ranging from microelectronics to wires and cables; a wealth of case studies; extremely comprehensive coverage of the entire industry.

There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.